INSTANT RFQ

4260519-1702 of Honeywell International Inc under NSN 5962-01-447-5768

Part Number: 4260519-1702
Alternate P/N: 42605191702
NIIN: 014475768
Item Name : Microcircuitmemory
CAGE Code: 64547
FSG: 59 Electrical and Electronic Equipment Components
Country: USA
NCB Code: 01

Thank you for taking an interest in our selection of 5962-01-447-5768 parts here on Boost AOG. You are currently on the RFQ form for part number 4260519-1702, a Honeywell International Inc product listed with the Microcircuitmemory If part number 4260519-1702 catches your eye, be sure to use our online RFQ service to request quotes, with customized responses provided within 15 minutes of us receiving and reviewing a completed submission.

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NSN Information for Part Number 4260519-1702 with NSN 5962-01-447-5768, 5962014475768

NSNFSCNIINCLSHazmatDEMILCancelled NSN
5962-01-447-5768

Item PartTypeName:

MICROCIRCUIT,MEMORY

59620144757680ND
CIICHCCESDPMICCriticalityENAC
7DA0
Part NumberISCRNVCRNCCHCCMSDSSADC
ROM/PROM FAMILY 220515

Characteristics Data of NSN 5962-01-447-5768, 5962014475768

MRCCriteriaCharacteristic
CZENVoltage Rating And Type Per Characteristic7.0 VOLTS MAXIMUM POWER SOURCE
CTQXCurrent Rating Per Characteristic70.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE
CZEQTime Rating Per Chacteristic10.00 NANOSECONDS ACC/PAC DETECTOR TINT CONTROL MAXIMUM
CBBLFeatures ProvidedBURN IN AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND PROGRAMMED
AFJQStorage Temp Range-65.0/+150.0 DEG CELSIUS
CQSJInclosure MaterialCERAMIC
ADATBody Width0.310 INCHES MAXIMUM
TTQYTerminal Type And Quantity20 PRINTED CIRCUIT
CWSGTerminal Surface TreatmentSOLDER
ADAQBody Length1.060 INCHES MAXIMUM
AEHXMaximum Power Dissipation Rating1.0 WATTS
CXCYPart Name Assigned By Controlling AgencyOVERSPEED TEST/RELAY
ADAUBody Height0.185 INCHES MAXIMUM
TESTTest Data Document96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
MRCDecoded RequirementClear Text Reply
CQSZInclosure ConfigurationDUAL-IN-LINE
AFGAOperating Temp Range-55.0/+125.0 DEG CELSIUS
CZERMemory Device TypePAL
CQWXOutput Logic FormCOMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC

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