Thank you for taking an interest in our selection of 5962-01-377-2578 parts here on Boost AOG. You are currently on the RFQ form for part number 639077-01, a Bae Systems Controls Inc product listed with the Microcircuit Memory If part number 639077-01 catches your eye, be sure to use our online RFQ service to request quotes, with customized responses provided within 15 minutes of us receiving and reviewing a completed submission.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-377-2578 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 013772578 | 0 | N | D | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
7 | D | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
639077-01 | 5 | 2 | 3 |
MRC | Criteria | Characteristic |
---|---|---|
CBBL | FEATURES PROVIDED | PROGRAMMED AND BIPOLAR |
CQWX | OUTPUT LOGIC FORM | BIPOLAR METAL-OXIDE SEMICONDUCTOR |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-8 MIL-M-38510 |
CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT DIGITAL,PAL MAJORITY VOTER/RECONFIG |
CZER | MEMORY DEVICE TYPE | PAL |
CZES | HYBRID TECHNOLOGY TYPE | MONOLITHIC |
FEAT | SPECIAL FEATURES | NUCLEAR HARDNESS CRITICAL ITEMS |
AFGA | OPERATING TEMP RANGE | -55.0/125.0 DEG CELSIUS |
AGAV | END ITEM IDENTIFICATION | FLIGHT CONTROL E/I FSCM 76823 |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM TOTAL SUPPLY AND 12.0 VOLTS MAXIMUM TOTAL SUPPLY |
NHCF | NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |
TEST | TEST DATA DOCUMENT | 07690-PG39000-01 DRAWING (THIS IS THE BASIC GOVERNING DRAWING,SUCH AS A CONTRACTOR DRAWING,ORIGINAL EQUIPMENT MANUFACTURER DRAWING,ETC.; EXCLUDES ANY SPECIFICATION,STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING D |
TTQY | TERMINAL TYPE AND QUANTITY | 20 PRINTED CIRCUIT |
CQZP | INPUT CIRCUIT PATTERN | 16 INPUT |
ZZZK | SPECIFICATION/STANDARD DATA | 67268-8506401RA GOVERNMENT STANDARD |
ZZZX | DEPARTURE FROM CITED DESIGNATOR | ALTERED BY PROGRAMMING & MARKING |
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