Thank you for taking an interest in our selection of 6625-00-902-9562 parts here on Boost AOG. You are currently on the RFQ form for part number TS2086U, a Abbey Electronics Corp product listed with the Test Set Semiconduc If part number TS2086U catches your eye, be sure to use our online RFQ service to request quotes, with customized responses provided within 15 minutes of us receiving and reviewing a completed submission.
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MRC | Criteria | Characteristic |
---|---|---|
SR-5 | MANUFACTURERS CODE | 14558 |
AFHS | ACCESSORY COMPONENT QUANTITY | 1 AND 1 AND 1 |
ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
ABGL | WIDTH | 5.500 INCHES NOMINAL |
SR-5 | THE MANUFACTURERS DATA | |
AEAS | MAJOR COMPONENTS | CABLE ASSEMBLY DEVICE;LEAD,TEST;ADAPTER,CRYSTAL SOCKET |
HGTH | HEIGHT | 5.750 INCHES NOMINAL |
AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TYPE NO. TS-2086/U |
SR-5 | DESIGN CONTROL REFERENCE | TT22 |
SURF | SURFACE TREATMENT | PAINT |
AQXY | TEST TYPE FOR WHICH DESIGNED | INCIRCUIT - SATURATION VOLTAGE AND RESISTANCE OF TRANSISTORS,DIODE AND SCR FORWATD,CHARACTERISTICS OUT-OF-CIRCUIT,SATURATION VOLTAGE AND RESISTANCE OF TRANSISTORS,DIODE AND SCR FORWARD,CHARACTEREISTICS,TRANSISTOR CURRENT GAIN,TRANSISTOR LEAKAGE CURRENT,REVERSE CHARACTERISTICS OF DIODES AND SCRS |
ANNQ | MATERIAL AND LOCATION | PLASTIC HOUSING |
AQXZ | OPERATING TEST CAPABILITY | SATURATION VOLTAGE - 0.3V,0-3V SATURATION RESISTANCE -0-10 X1,X10,X100,COLLECTOR TEST CURRENT - 2.5,25,250 MA REVERSE LEAKAGE CURRENT - 0-30,VA,0.3 MA,0-30MA,0-300 MA,CURRENT GRAIN,BETA - 1-30,10-300,ACCURACY - PORM 5 PCT IN-CIRCUIT,PORM 3 PCT OUT-OF-CIRCUIT |
AKVZ | ACCESSORY IDENTIFYING NUMBER | A2262006 PART NO. AND A2262007 PART NO. AND A2202047 PART NO. |
AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST SET,SEMICONDUCTOR DEVICE |
ABRY | LENGTH | 8.000 INCHES NOMINAL |
AKVY | ACCESSORY CONTROLLING AGENCY | ABBEY ELECTRONICS CORP AND ABBEY ELECTRONICS CORP AND ABBEY ELECTRONICSCORP |
ZZZV | III FSC APPLICATION DATA | ELECTRICAL AND ELECTRONIC PROPERTIES MEASURING AND TESTING INSTRUMENTS |
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