If you are looking for NSN 6625-00-179-5844 supplies, turn to Boost AOG and our vast collection of offerings. On this page, we have arranged our NSN 6625-00-179-5844 inventory, where part numbers like 902-470, ANUSM206A, and others are presented alongside relevant information about this NSN for your perusal. Take the time to browse our ever-expanding selection of components as you see fit, and if any particular items pique your interest, be sure to use our online RFQ service to request quotes for your consideration.
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Item Name | Test Set Semiconduc |
Federal Supply Group (FSG) | Instruments and Laboratory Equipment |
Federal Supply Class (FSC) | 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
National Item Identification Number (NIIN) | 00-179-5844 (001795844) |
NCB Code | USA (00) |
Manufacturer | Joint Electronics Type Designation System, Hickok Incorporated |
Part Number | Manufacturer | Item Name | Cage Code | RFQ |
---|---|---|---|---|
902-470 | joint electronics type designation system | test set semiconduc | 80058 | RFQ |
902-470 | hickok incorporated | test set semiconduc | 28569 | RFQ |
ANUSM206A | hickok incorporated | test set semiconduc | 28569 | RFQ |
ANUSM206A | joint electronics type designation system | test set semiconduc | 80058 | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
AFHS | ACCESSORY COMPONENT QUANTITY | 1 AND 1 AND 1 AND 1 |
ACYN | AC VOLTAGE RATING | 115.0 VOLTS NOMINAL |
FAAZ | PHASE | SINGLE |
AQXY | TEST TYPE FOR WHICH DESIGNED | TRANSISTOR BETA AND TRANSCONDUCTANCE MEASUREMENTS;DIODE AND TRANSISTOR ELECTRODE RESISTANCE;DIODE AND TRANSISTOR REVERSE LEAKAGE MEASUREMENTS;SHORTED OR OPEN DIODE TEST;BATTERY TESTS |
ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
ACYR | DC VOLTAGE RATING | 2.0 VOLTS MINIMUM AND 9.0 VOLTS MAXIMUM |
AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TYPE NO. AN/USM-206A |
ABRY | LENGTH | 9.000 INCHES NOMINAL |
ANNQ | MATERIAL AND LOCATION | PLASTIC CARRYING CASE |
AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST,SEMICONDUCTOR DEVICE |
AQXZ | OPERATING TEST CAPABILITY | METER;MICROMHOS;BETA;LEAKAGE TEST;BATTERY TEST |
AKVY | ACCESSORY CONTROLLING AGENCY | JETDS AND JETDS AND JETDS AND JETDS |
AKVZ | ACCESSORY IDENTIFYING NUMBER | TS-2798/USM-206A TYPE NO. AND CW-1049/USM-206A TYPE NO. AND CX-11898/USM-206A TYPE NO. AND MX-6825A/USM-206A TYPE NO. |
ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
HGTH | HEIGHT | 10.000 INCHES NOMINAL |
AEAS | MAJOR COMPONENTS | TEST SET,SEMICONDUCTOR DEVICE;COVER,TEST SET;LEAD,TEST;PROD,TEST |
ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM |
ABGL | WIDTH | 8.000 INCHES NOMINAL |
Relevant Components for NSN - 6625-00-179-5844, 6625001795844 | ||||
6645-01-335-5713 (6645013355713) | 6685-01-518-0959 (6685015180959) | 6635-01-378-5444 (6635013785444) | 6680-00-663-5123 (6680006635123) | |
6685-00-527-7041 (6685005277041) | 6680-01-003-5904 (6680010035904) | 6625-01-483-2569 (6625014832569) | 6625-00-449-1265 (6625004491265) | |
6675-01-276-5403 (6675012765403) | 6625-01-461-5023 (6625014615023) | 6625-01-110-4185 (6625011104185) | 6695-01-442-7958 (6695014427958) | |
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