HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS
CQSJ
INCLOSURE MATERIAL
CERAMIC AND GLASS
CQSZ
INCLOSURE CONFIGURATION
DUAL-IN-LINE
CQWX
OUTPUT LOGIC FORM
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
CQZP
INPUT CIRCUIT PATTERN
QUAD 2 INPUT
CSSL
DESIGN FUNCTION AND QUANTITY
4 GATE,NOR
CTFT
CASE OUTLINE SOURCE AND DESIGNATOR
D-1 MIL-M-38510
CWSG
TERMINAL SURFACE TREATMENT
SOLDER
CZEN
VOLTAGE RATING AND TYPE PER CHARACTERISTIC
18.0 VOLTS MAXIMUM POWER SOURCE
CZEQ
TIME RATING PER CHACTERISTIC
315.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 315.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
TEST
TEST DATA DOCUMENT
81349-MIL-M-38510 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI
TTQY
TERMINAL TYPE AND QUANTITY
14 PRINTED CIRCUIT
ZZZK
SPECIFICATION/STANDARD DATA
81349-MIL-M-38510/52 GOVERNMENT SPECIFICATION
Relevant Components for NSN - 5962-01-160-2383, 5962011602383
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