HERMETICALLY SEALED AND BURN IN AND HIGH PERFORMANCE AND MONOLITHIC AND W/ENABLE AND SCHOTTKY AND W/STORAGE
CQSJ
INCLOSURE MATERIAL
CERAMIC
CQSZ
INCLOSURE CONFIGURATION
DUAL-IN-LINE
CQWX
OUTPUT LOGIC FORM
TRANSISTOR-TRANSISTOR LOGIC
CQZP
INPUT CIRCUIT PATTERN
10 INPUT
CWSG
TERMINAL SURFACE TREATMENT
SOLDER
CZEN
VOLTAGE RATING AND TYPE PER CHARACTERISTIC
7.0 VOLTS MAXIMUM POWER SOURCE
CZEQ
TIME RATING PER CHACTERISTIC
50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
CZER
MEMORY DEVICE TYPE
RAM
CZZZ
MEMORY CAPACITY
UNKNOWN
TEST
TEST DATA DOCUMENT
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).
TTQY
TERMINAL TYPE AND QUANTITY
16 PRINTED CIRCUIT
Relevant Components for NSN - 5962-01-102-5314, 5962011025314
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