HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS
CQSJ
INCLOSURE MATERIAL
CERAMIC AND GLASS
CQSZ
INCLOSURE CONFIGURATION
DUAL-IN-LINE
CQWX
OUTPUT LOGIC FORM
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
CQZP
INPUT CIRCUIT PATTERN
TRIPLE 3 INPUT
CSSL
DESIGN FUNCTION AND QUANTITY
3 GATE,NAND
CTFT
CASE OUTLINE SOURCE AND DESIGNATOR
-0-001-AD JOINT ELECTRON DEVICE ENGINEERING COUNCIL
CZEQ
TIME RATING PER CHACTERISTIC
120.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT
TEST
TEST DATA DOCUMENT
81349-MIL-STD-883 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI
Relevant Components for NSN - 5962-01-033-2270, 5962010332270
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